With advanced chamber vacuum technology, the Inspect™ line of scanning electron microscopes (SEM) builds on FEI's world-class electron optics and sample throughput technologies. When inspection, characterization, process control and failure analysis are important, the Inspect S50 and Inspect F50 models' high-resolution imaging is a must. The intuitive user interface and software, with all functions required to record and store an image accessed directly via a tool bar, is well suited for a multi-user environment while full stage access to accommodate a range of specimen holders adds value and flexibility for a range of uses. The Inspect line of tools includes two scanning electron microscopes , one SEM with tungsten and another SEM with FEG, for use where high-resolution imaging is routine. These cost-effective, flexible, state-of-the-art scanning electron microscopes are built using FEI's advanced technology, making them valuable for industrial manufacturers and researchers working with material characterization and inspection applications. The FEI Tecnai™ transmission electron microscopes (TEMs) are designed to offer a truly universal imaging and analysis solution for life sciences, materials sciences, nanotechnology, and the semiconductor and data storage industries. With nearly twenty models to choose from, the Tecnai G2 Series combines modern technology with the stringent demands of an innovative scientific community.
QEMSCAN® is a fully automated, non-destructive, micro-analysis system that provides rapid, statistically reliable and repeatable, mineralogical, petrographic and metallurgical data, from virtually any inorganic, and some organic, materials. It is used in the mining industry for mineral exploration, ore characterization, and mineral process optimization applications. The oil and gas industry utilizes QEMSCAN to reduce risk and improve extraction, based on knowledge derived from the micro-analysis of drill cuttings and cores. The coal industry is applying automated analysis of coal, pulverized fuel and coal combustion products, to better understand coal combustion and waste utilization.
The MLA (an acronym for Mineral Liberation Analyzer) is an automated mineral analysis system that can identify minerals in polished sections of drill core, particulate, or lump materials, and quantify a wide range of mineral characteristics, such as mineral abundance, grain size, and liberation. Mineral texture and degree of liberation are fundamental properties of ore and drive its economic treatment, making the data gathered by the MLA invaluable to geologists, mineralogists and metallurgists who engage in process optimization, mine feasibility studies, and ore characterization. The MLA (an acronym for Mineral Liberation Analyzer) is an automated mineral analysis system that can identify minerals in polished sections of drill core, particulate, or lump materials, and quantify a wide range of mineral characteristics, such as mineral abundance, grain size, and liberation. Mineral texture and degree of liberation are fundamental properties of ore and drive its economic treatment, making the data gathered by the MLA invaluable to geologists, mineralogists and metallurgists who engage in process optimization, mine feasibility studies, and ore characterization.
The Verios is the second generation of FEI’s leading XHR (extreme high resolution) SEM family. It provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
The FEI Quanta line includes six variable-pressure and environmental scanning electron microscopes (ESEM™). All of which can accommodate multiple sample and imaging requirements for industrial process control labs, materials science labs and life science labs.
The Nova NanoSEM™ scanning electron microscope delivers best in class imaging and analytical performance in a single, easy-to-use instrument. Specifically designed to streamline operations in your laboratory, the Nova NanoSEM enables owners the ability to gain the most comprehensive answers in the least amount of time. This propels productivity, without sacrificing on the quality imaging you demand from your daily work. With the Nova NanoSEM 50 series, even more becomes possible. In addition to the powerful combination of advanced optics (including a two-mode final lens), SE/BSE (Secondary Electrons/Backscattered Electrons) in-lens detection and beam deceleration, the Nova NanoSEM 50 series introduces a new suite of latest generation, high sensitivity retractable SE/BSE and STEM detectors, as well as versatile SE/BSE filtering capabilities, to best optimize the information of interest. Intelligent scanning modes are available to minimize imaging artifacts.
The Aspex Product Group from FEI is a collection of scanning electron microscopes for industrial microscopy solutions which help to optimize quality control, production capacity, and profitability. Suitable for the most rugged environments, Aspex solutions are used in demanding military, oilfield, industrial, and factory floor settings. Through SEM technology and LN-free EDX spectrometry, this family of SEM's specializes in automated particle analysis that can rapidly detect the size, shape and elemental composition of an entire sample. By providing the power to quickly turn data into knowledge, users in an industrial space have the ability to make critical quality control decisions with confidence.