The first TEM dedicated to the semiconductor industry The Metrios system is the first TEM dedicated to providing the fast, precise measurements that semiconductor manufacturers need to develop and control their wafer fabrication processes. Extensive automation of the basic TEM operation and measurement procedures minimizes requirements for specialized operator training. Its advanced automated metrology routines deliver greater precision than manual methods. The Metrios TEM is designed to provide customers with improved throughput and lower cost-per-sample than other TEMs.
Since its introduction in 2005, the Titan's superior product design and proven ability to deliver ground-breaking results have made it the preferred scanning/transmission electron microscope (S/TEM) of leading researchers around the world. FEI's Titan S/TEM platform is constantly evolving, and the Titan TEM family is now the world's most powerful, commercially-available suite of S/TEM solutions, with Titan™ Themis, Titan Krios™ and Titan™ ETEM. All start with our revolutionary wide high-tension range and corrector-ready platform, combined with a wide pole piece gap delivering the space to do more. Developed with stability and flexibility in mind, Titan's high performance continuously enables atomic scale discovery and exploration.
The FEI Tecnai™ transmission electron microscopes (TEMs) are designed to offer a truly universal imaging and analysis solution for life sciences, materials sciences, nanotechnology, and the semiconductor and data storage industries. With nearly twenty models to choose from, the Tecnai G2 Series combines modern technology with the stringent demands of an innovative scientific community.
Talos™ is a new generation in TEM, built to deliver rapid access to 2D and 3D data so that you can concentrate on discovery. With configurations for materials research and life sciences research, Talos is a truly versatile system with many innovations that will serve your research needs for years to come.